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Condensed Matter - Materials Science
Non-Speckle-based DVC for Measuring Large Deformations in Homogeneous Solids using Laboratory X-ray CT
X-ray computed tomography (XCT) has become a reliable metrology tool for measuring internal flaws and other microstructural features in …
Zifan Wang
,
Akshay Joshi
,
Angkur Jyoti Dipanka Shaikeea
,
Vikram Susdhir Deshpande
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